ASIC工程师，可测试性设计

Define and implement comprehensive DFT architectures including scan insertion, ATPG, MBIST, LBIST, and boundary scan for large-scale infrastructure ASICs

Develop and drive DFT methodology and flows from RTL through tape-out, including scan compression, test point insertion, and clock domain handling

Generate, simulate, and validate ATPG test patterns to achieve target fault coverage across stuck-at, transition, path delay, and cell-aware fault models

Collaborate with physical design teams to ensure DFT structures meet timing, area, and power constraints during implementation

Partner with silicon validation and manufacturing test teams to define ATE test programs and support post-silicon debug and diagnosis

Perform DFT sign-off including fault coverage analysis, test coverage reporting, and DRC/LVS compliance for testability structures

Develop and maintain DFT scripts and automation to improve flow efficiency, reduce manual effort, and enable reuse across chip generations

Support silicon bring-up activities by analyzing failure data, performing scan diagnosis, and identifying root causes of manufacturing defects

Contribute to DFT roadmap planning by evaluating emerging test methodologies and recommending improvements to Meta's silicon test strategy

Provide technical guidance to peers on DFT best practices, design partitioning for testability, and cross-functional trade-off decisions

Bachelor's degree in Computer Science, Computer Engineering, relevant technical field, or equivalent practical experience

6+ years of experience in DFT engineering for complex ASIC or SoC designs, including scan insertion, ATPG pattern generation, and MBIST implementation

Experience with industry-standard DFT EDA tools for scan compression, ATPG, and memory test (e.g., Tessent, Synopsys DFT Compiler, TetraMAX)

Experience achieving high fault coverage targets across multiple fault models (stuck-at, transition delay, cell-aware) on multi-million gate designs

Experience supporting silicon bring-up and manufacturing test, including ATE correlation and scan-based diagnosis

Familiarity with IEEE 1500, IEEE 1687 (IJTAG), or IEEE 1149.1 boundary scan standards and their application in infrastructure ASICs

Background in post-silicon failure analysis and yield improvement using scan diagnosis and statistical defect modeling

Experience with at-speed test methodologies including launch-on-capture and launch-on-shift for timing-critical paths

Experience with DFT architecture for high-speed SerDes interfaces, mixed-signal IP, or hierarchical test integration in large multi-die or chiplet designs

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Bachelor's degree in Computer Science, Computer Engineering, relevant technical field, or equivalent practical experience.

6+ years of experience in DFT engineering for complex ASIC or SoC designs, including scan insertion, ATPG pattern generation, and MBIST implementation.